From September 6 to 11, the 35th Conference on Precision Electromagnetic Measurements (CPEM 2026 Madrid) was held in Madrid, Spain, hosted by the Centro Español de Metrología (CEM). TUNKIA participated in the conference in four capacities—as a sponsor, exhibitor, paper author, and conference delegate—becoming the first Chinese company in CPEM history to become a sponsor.
The Conference on Precision Electromagnetic Measurements (CPEM) is a leading international conference in the field of precision electromagnetic measurements. Held every two years, it focuses on cutting-edge areas such as quantum technology, clean energy, and digital measurement. This year’s CPEM brought together more than four hundred metrology scientists, researchers, and representatives of scientific instrument manufacturers from around the world.
At the conference, TUNKIA presented two academic papers:
“Precision Sampling-Based Vector Voltage Analyzer”
“IPMA, a Novel Modular Architecture for Cutting-Edge Scientific Instruments”
The two papers focused on two key areas: precision sampling technology for vector voltage measurement (Type A uncertainty for dual-channel ratio measurement: magnitude 0.05 μV/V@1 kHz, phase difference 0.02 μrad@1 kHz), and a modular architecture for scientific instruments. Through these presentations, TUNKIA shared its independently developed advanced technologies and research achievements with the international metrology community, demonstrating the active participation of Chinese companies in the research and development of leading-edge precision electromagnetic measurement technologies and bringing technological solutions from China to the global community.
At the exhibition booth, TUNKIA showcased a range of its latest high-end instruments developed in-house, including the TH2000 Vector Voltage Analyzer, TH0500 Current Transfer and Measurement Standard, TD1880 Precision Multi-function Calibrator (IPMA),and TE1000 EV Charger Energy Standard – European Version. The exhibits showcased TUNKIA’s comprehensive portfolio of high-end precision electromagnetic measurement solutions and attracted experts from more than 30 national metrology institutes, including NIST, PTB, NPL, and LNE, who visited the TUNKIA booth for technical discussions and exchanges. TUNKIA’s solutions received recognition and strong interest from metrology experts from various countries.
TUNKIA’s in-depth participation in CPEM marks a major milestone for TUNKIA’s high-end electromagnetic measurement instruments in their global expansion. TUNKIA has already received invitations to participate in the next two editions of CPEM. TUNKIA will continue to engage in international dialogue and exchange in the field of precision electromagnetic measurements.
Going forward, TUNKIA will continue to pursue technological innovation, help bring precision measurement technologies to the world, and advance the development of global metrology.
